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Electro-Optic detector (EOD) is intended for registration of the pulsed terahertz (THz) radiation. It is characterized by availability of integrated optics as well as built-in lock-in amplifier. The detector has the following functions: signal conditioning; automatic signal balance fine tuning on photo-detectors. Facility of mechanical delay circuit control by means of the proprietary software supplied with the EOD is envisaged. Application field of the device includes time-domain spectroscopy (TDS).

Built-in optics provides capability to integrate this detector into a finished measuring circuit (experimental circuit, etc). A lock-in amplifier provides high signal/noise ratio as well as makes the detector itself more compact and convenient when installing and operating. Signal conditioning function ensures invariance of the high signal/noise ratio and accurate measurement of time shape of THz impulse in case of power level fluctuations of the input signal and pumping laser.

Model of the EOD

EOD-NIR

EOD-MIR

EO optical pair crystal – photodiode

ZnTe – Si

CdTe – InGaAs

Signal radiation wavelength, nm

600–1100

1100­­–1700

Signal radiation spectral width(Full width at half maximum /FWHM/), nm

11–20

Spectral sensitivity, THz

0.1–4

Signal radiation impulse duration, fs

<120

Signal-carrying beam power, mW

1–20

Minimal required power of THz radiation, nW

1

Lock-in amplifier modulation frequency, Hz

15–250000

Lock-in amplifier gain

100–30000

Lock-in amplifier time constant, s

0.003–10

Operating temperature, °C

5–45

Storage temperature, °C

0–60

Air humidity, %

5–85

Voltage, V

110 / 220

Frequency, Hz

50

Power consumption, W

18

EOD overall dimensions (L×W×H), mm

268.0×82.0×42.5

Weight, kg

0.8

THz Impulse Radiation Electro-Optical Detector

Modern software developed for operation with Windows operating system (XP, Vista, 7) enables easy control of the EOD parameters, and display of the measurement data. There is also a facility to control of the delay-line of the TDS system.